1. Project description.

Thermal (also known as THERMOS, Elite or LIT) are all thermal imaging analysis programs that are a form of dynamic infrared thermal imaging that uses a square wave current input at the same frequency and a camera switch for higher resolution results compared to stable thermal imaging LIT is performed in a natural ambient environment without a shade box. Defective or poorly performing semiconductor devices typically exhibit anomalous local power distribution, which can eventually lead to increased local temperatures. Enhanced thermal imaging utilizes phase-locked infrared thermography (LIT) to accurately and efficiently locate these areas of concern.

Equipment factor:

Infrared detector: InSb Lock-in function: Yes
Thermal image pixels: 640*512 Voltage: ±200V, Current: ±1A
Maximum field of view: 200*160mm Lens list: WD/1X/10X/CCD 
Power sensitivity: uW

2. Application advantages.

Phase-locked thermal imaging (LIT) is a form of dynamic infrared thermal imaging that provides substantially improved signal-to-noise ratio, enhanced sensitivity, and higher feature resolution compared to steady-state thermal imaging. In IC analysis, LIT can be used to identify circuit shorts, ESD defects, oxide damage, defective transistors and diodes, and device latch-up. lIT is performed in a natural ambient environment without the need for a shade box. Wintech Nano’s enhanced thermal imaging is the most sensitive hotspot system on the market today, with no end absolute temperature, reply to improve signal-to-noise ratio/resolution; it can provide customers with short circuit, leakage location, applied to system PCBA/module/chip, line short, ESD/EOS, and power device defects can be distinguished.