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Electrical analysis

Electrical analysis

  • Categories:Solutions
  • Time of issue:2022-05-18 17:47:32
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Description:
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In order to meet the needs of various semiconductor devices, it is necessary to measure the electrical parameters of the material, which are generally resistivity, carrier concentration, conduction type, mobility, lifetime, and carrier concentration distribution.

 

1. ESD/EOS Test

 

ESD testing is used to verify that products can withstand electrostatic discharge (ESD) events and other threats, ensure that integrated circuit chips and other electronic products meet national, international and industry ESD testing standards, and can provide a full range of HBM/MM/LATCH-UP/CDM/TLP tests.

 

2. Electrical Testing and Failure Analysis Capabilities and Applications (EFA)

 

Package/device-level Fault Isolation

PCB Failure Analysis

Electrical Testing

ESD/EOS Testing lab

2D/3DX-ray analysis NDT 2D/3D X-ray CT

RF devices, LED lasers, optoelectronic devices, CMOS devices and other semiconductor devices

 

3. Main equipment

 

　　Nanoprobe

　　EMMI / OBIRCH

　　Thermal

　　2D XRAY

　　3D CT -XRAY

　　SAT (SAM)

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