- Categories:Test Services
- Time of issue:2022-05-18 16:14:06
1. Project definition:
NanoProbe integrates EBA/EBIC/EBIRCH and other multi-functional failure analysis capabilities, which can realize open/short circuit positioning of chip lines; Transistor PN section imaging/leakage positioning.
2. Application advantages:
It is especially suitable for the development and failure analysis of new products, used to improve yield, solve quality and reliability problems, and customer complaints.
Scan the QR code to read on your phone