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EBIC/EBAC

Categories:Test Services
Time of issue:2022-05-18 16:14:06
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Description:

Information

1. Project definition:

NanoProbe integrates EBA/EBIC/EBIRCH and other multi-functional failure analysis capabilities, which can realize open/short circuit positioning of chip lines; Transistor PN section imaging/leakage positioning.

2. Application advantages:

It is especially suitable for the development and failure analysis of new products, used to improve yield, solve quality and reliability problems, and customer complaints.

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