Advanced (FIB) Focused Ion Beam Services

Wintech Nano’s Focused Ion Beam (FIB) services are at the forefront of materials science and nanotechnology, offering unparallel precision in the analysis and manipulation of materials at the nanoscale.;

What is Focused Ion Beam (FIB)

A Focused Ion Beam (FIB) is an advanced scientific instrument that uses a highly focused beam of ions (typically gallium ions) to image, mill, and modify materials at the micro- and nanoscales. FIB systems are used in various applications, including:

  • Imaging: High-resolution imaging of materials, similar to scanning electron microscopy (SEM)
  • Sample Preparation: Preparing samples for transmission electron microscopy (TEM) by thinning and extracting specific regions
  • Material Modification:Milling, cutting, or depositing materials with nanometer precision
  • Failure Analysis: Investigating and analyzing material failures in semiconductors and other devices
  • Nanofabrication: Creating nanostructures and patterns for research and development in nanotechnology

FIB technology is essential in materials science, semiconductor manufacturing, and other fields requiring precise material characterization and modification.

Significance of FIB in Material Analysis

FIB technology enables detailed visualization, modification, and characterization of materials, driving innovation across various fields.

With capabilities ranging from high-resolution imaging to intricate etching and deposition, FIB is essential for researchers and engineers aiming to push boundaries and develop cutting-edge applications.

Quality and Reliability

The precision of FIB is crucial for quality assurance, ensuring that products meet stringent industry standards.

FIB’s ability to perform meticulous etching and deposition with critical dimensions under 10 nm makes it indispensable for maintaining high product quality and reliability.

Role of FIB in the Industry

FIB technology has a profound impact across various industries.

In the semiconductor industry, it is essential for device modification, circuit editing, and failure analysis.

In materials science, FIB prepares samples for Transmission Electron Microscopy (TEM), allowing atomic-scale investigation of materials. 

Its applications extend to biological specimen preparation and nanofabrication, supporting advancements in optics, catalysis, and quantum computing.

Wintech Nano’s Expertise in FIB

Wintech Nano distinguishes itself with advanced FIB technology, featuring at the core of our cutting-edge offerings the Helios G5 UX, an integral component of the renowned fourth-generation Helios DualBeam™ series. 

This advanced FIB system is engineered to support high-resolution transmission electron microscopy (HR-TEM) and atom probe tomography (APT) sample preparation, delivering superior imaging quality and precise control for etching and deposition processes.

The Helios G5 UX sets a new standard in the industry, offering unmatched capabilities for detailed analysis and manipulation of materials at the nanoscale, ensuring our clients have access to the forefront of FIB technology.

Our technical team’s deep knowledge and extensive experience ensure precision and care in every project.

Why Choose Wintech Nano

Choosing Wintech Nano for your FIB scanning needs places you at the forefront of materials analysis and nanofabrication, offering a range of distinct advantages:

Advanced Instrumentation

We use the latest FIB technology, ensuring superior resolution, precision, and versatility in material manipulation and analysis.

This guarantees that your projects benefit from cutting-edge advancements, providing clear, detailed, and accurate results.

Expertise and Experience

Our skilled professionals are well-versed in a wide array of FIB techniques and applications. 

With years of experience and deep technical knowledge, our team ensures that your FIB scanning is executed with utmost proficiency, delivering insights and results that can propel your research or product development forward.

Collaborative Approach

As an industry leader, we see ourselves as an extension of your team, committed to your success.

We maintain open communication throughout the FIB scanning process, keeping you informed and engaged, ensuring that the final results meet your expectations and advance your goals.

Quality and Reliability

Our unwavering commitment to quality and reliability ensures that you receive dependable and consistent results.

Our rigorous quality control processes and attention to detail mean that you can trust us to deliver high-quality services that support your achievements and growth.

By choosing Wintech Nano, you gain a partner dedicated to providing the best in FIB scanning technology, expertise, and customer support

FIB Applications and Advantages

Our FIB services offer numerous application advantages, including:

  • High-Resolution Imaging: Unparalleled clarity in observing material structures
  • Precise Etching and Deposition:Meticulous material modification at the nanoscale
  • Detailed Material Analysis: Comprehensive insights into material composition and properties
  • 3D Reconstruction Services: In-depth understanding of material structures

Tailored FIB Solutions

At Wintech Nano, we recognize that each client has unique needs and challenges, which is why we offer custom FIB solutions tailored to specific research and industrial objectives.

Using our advanced FIB technology, we work closely with our clients to develop innovative approaches that solve complex problems, enhance product features, and uncover new material phenomena.

Our commitment to delivering customized, cutting-edge solutions underscores our role as a trusted partner in your pursuit of excellence and innovation.

Work with Wintech Nano for Your FIB Needs

Choosing Wintech Nano for FIB services means partnering with a leader in material characterization and nanofabrication. 

Our commitment to advanced technology and customer-focused solutions ensures that your materials achieve the highest standards of quality and performance.

Contact us today to learn how our advanced FIB services can benefit your material analysis needs. Embrace the precision and clarity that only Wintech Nano can provide – your journey to material mastery begins here!