1. Project definition.

EMMI micro light microscope, also known as PEM, InGaAs or CCD, is to determine the location of leakage by observing the weak emission caused by chip leakage to help fault analysis, is a multilayer metal wire chip, LOC structure, flip chip and CSP, etc., integrated circuit chip front and back analysis is essential technology.

2. Application advantages.

Wintech Nano front and back EMMI integrates an infrared focal microscope to achieve a high resolution InGaAs probe of 1024*1024 pixels, penetrating 1mm chip back imaging, IROM background overlay positioning, which can detect very weak emission in the infrared wavelength region with high sensitivity, front and back can be positioned, and the chip on the board can be positioned directly after opening to help customers detect IV curve leakage drift.