Device DPA

DPA analysis (Destructive Physical Analysis) is destructive physical analysis, referred to as DPA, to test component samples for non-destructive analysis and destructive analysis, randomly select 1% ~ 2% or 2 ~ 5 samples to verify whether the design, structure, materials and manufacturing quality of components meet the requirements of the intended use or relevant specifications.

DPA is one of the important methods of quality assurance of high-reliability components, which is mainly used for batch quality evaluation and is also suitable for quality control in the production process. DPA can find process defects in product design, structure, assembly and other processes that are not necessarily exposed in routine screening inspections.

DPA analyzes benefits

Component manufacturers: understand product quality, improve product design process, reduce business risks; System Integrator: Enhance procurement quality monitoring, eliminate early hazards, and improve product reliability.

DPA mainly analyzes the project

1. Visual Inspection
2. X-ray inspection
3. Ultrasound examination C–SAM
4. Open Decap/Take DIE
5. Internal Inspection
6. Slice Cross-section
7. Electron microscopy SEM/EDAX
8. Pull Test
9. Bonding strength
10. Attachment strength
11. Terminal strength
12. Airproof Check
13. Integrity Inspection Passivation
14. Sampling with Microscop
15. Physical Check
16. Particle Noise PIND
17. Contact Check
18. Shear Strength Test Shear Test

DPA analysis flowchart

DPA’s main analytical instruments and equipment:

Optical Microscope


Infrared microscope FTIR

Slice Cross section


Peel strength

Stretch the tensile test

X-fluorescent surface thickness XRF/thickness

SEM/EDX spectroscopy of SEM/EDX

Shear/Pull test

Thermomechanical/differential scanning analysis TMA/DSC(Tg, CTE, TD, cure factor)

Thermogravimetric analysis TGA(Td, moisture content)

Strain measurement (Heat sink process simulation)

Impedance TDR

Ultrasound scan SAT

Kaifeng De-cap

Electrical test LCR

DPA main analysis cases:

The case of the Hitachi SU5000 SEM