EDX
1. Project introduction:
EDX is the determination of the elements contained in the sample by analyzing the X-ray wavelength and intensity of the elements emitted by the sample, and the relative content of the elements according to the intensity. Talos Dual-X SDD: 2 EDX probes for fast imaging and high resolution.
The Dual-X’s EDX collection is more efficient
EDS system |
Super-X |
Dual-X |
Full solid angle |
0.9 srad |
2.56 srad |
Effective solid angle* |
0.9 srad |
1.65 srad |
Detectors |
4 SDD, built-in design | 2 large SDD, retractable design |
2. Application advantages:
Examples of large-area, high-resolution HAADF STEM and EDS drawings using the “Dual-X” detector.
Sample: Gold-nickel nanoparticles, collection time< 1min.